Is it meaningful to quantify vacancy concentrations of nanolamellar (Ti,Al)N thin films based on laser-assisted atom probe data?

Hans, Marcus (Corresponding author); Tkadletz, Michael; Primetzhofer, Daniel; Waldl, Helene; Schiester, Maximilian; Bartosik, Matthias; Czettl, Christoph; Schalk, Nina; Mitterer, Christian; Schneider, Jochen M.

Amsterdam [u.a.] : Elsevier Science (2023)
Journal Article

In: Surface and coatings technology
Volume: 473
Page(s)/Article-Nr.: 130020


  • Division of Materials Science and Engineering [520000]
  • Chair of Materials Chemistry [521110]