Semantic models for field device performance monitoring in the process industry in the context of industry 4.0

Hana, Ramy Sherif Labib; Kleinert, Tobias Theodor

Düsseldorf : VDI Verlag (2023)
Contribution to a book, Contribution to a conference proceedings

In: Transformation by automation : Automation 2023 : 24. Leitkongress der Mess- und Automatisierungstechnik : 27. und 28. Juni 2023, Baden-Baden / VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik
Page(s)/Article-Nr.: 233-243

Institutions

• Division of Materials Science and Engineering [520000]
• Chair of Information and Automation Systems for Process and Material Technology [526610]