An in situ ToF-LEIS characterization of the surface of Ti-based thin films under oxygen exposure and at elevated temperatures
Wolf, Philipp M. (Corresponding author); Neuß, Deborah; Tran, Tuan T.; Pitthan, Eduardo; Hans, Marcus; Schneider, Jochen M.; Primetzhofer, Daniel
Amsterdam : Elsevier (2023)
Journal Article
In: Applied surface science
Volume: 638
Page(s)/Article-Nr.: 158076
Institutions
- Division of Materials Science and Engineering [520000]
- Chair of Materials Chemistry [521110]
Identifier
- DOI: 10.1016/j.apsusc.2023.158076
- DOI: 10.18154/RWTH-2023-07399
- RWTH PUBLICATIONS: RWTH-2023-07399